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European countries and Russia

Posted: Tue Feb 18, 2025 4:16 am
by zihadhosenjm40
Many oscilloscope models have another control for the synchronization circuit, the smooth adjustment knob "STABILITY", changing its position changes the time of insensitivity of the sweep generator to the triggering event ("dead time" of the sweep generator). In one extreme position, the sweep generator is switched to self-oscillating mode, in the other extreme position - to the standby mode, in intermediate positions it changes the frequency of sweep triggering. Usually, in oscilloscopes equipped with this adjustment, there is no switch of the sweep mode "STANDBY/AUTOMATIC"

As has been said, an additional sweep synchronization input is loan data always provided, and there is an “EXTERNAL/INTERNAL” sweep start switch. When in the “EXTERNAL” position, the voltage from the synchronization input, rather than the signal being studied itself, is fed to the sweep synchronization circuit input.

There is often a switch for synchronization from the power grid (in - 50 Hz, in some other countries - 60 Hz), when synchronizing from the grid, voltage with the grid frequency is supplied to the input of the synchronization circuit. Such synchronization is convenient for observing signals with the grid frequency, or signals multiples of this frequency, for example, grid interference, measuring the parameters of grid filters, rectifiers, etc.

Specialized oscilloscopes also have special synchronization modes, for example, a mode for starting the sweep at the start of a line number specified by the operator in the frame of a television signal, which is convenient when measuring the parameters of a television path and its individual stages in television systems.

In other specialized oscilloscopes used in the study of digital (e.g. microprocessor) devices, the synchronization circuit is supplemented by a code comparator and the sweep is started when the binary code (word) specified by the operator matches the code on the bus, for example, an address. This is convenient for finding the cause of failures when writing/reading a certain memory cell and other diagnostics.

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